04.02.2020 Prof. Dr. Fritz Keilmann

17:15 Uhr im Seminarraum 1.27 Von-Danckelmann-Platz 4, 06120 Halle

Faculty of Physics, Soft Condensed Matter Group, Ludwig-Maximilians-Universität, München

Infrared near-field microscopy

Abstract:
Infrared illumination of an AFM tip can produce infrared images ontop of topography at, surprisingly, identical super-resolution of 20 nm. In my talk I explain how and why this is possible (hint: surface waves), and describe applications.
The technique called scattering-type optical near-field microscopy (s-SNOM) enables quantitative chemical recognition of nanoscale inhomogeneities, e.g., during insulator-metal phase transitions, in polymer mixtures, or in cometary matter. It has allowed to study the nanoscale architecture of biominerals and, recently, electron correlation on twisted bilayer graphene even at LHe temperature.

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