Department of Physics, Bayreuth University
“Characterizing the effect of external parameters and processing on the nanostructure of functional thin films”
Abstract:
Structure formation mechanisms and structural changes in thin films due to external parameters can be revealed using time-resolved x-ray scattering. Since scattering techniques rely on the long range order within the sample, it can be very valuable to accompany such x-ray measurements with additional complementary characterization methods like time-resolved spectroscopy or optical microscopy.
Using examples from organic photovoltaics and hybrid perovskite solar cells, I will show our recent work on processing effects on nanostructure formation and related challenges to their characterization.
